Meet our experts at SPIE Photonics West 2026
January 20 – 22, 2026 | Moscone Center | TRIOPTICS / Jenoptik booth 1149
We look forward to exhibiting at the Moscone Center San Francisco, California, United States at this year SPIE Photonics West. Stop by if you are looking for innovative solutions in optical metrology.
Highlights at our Photonics West booth #1149
New measurement system SurfInspect for automated quality assessment of scratch & dig
TRIOPTICS introduces SurfInspect, an automated inspection system for the objective surface quality evaluation of flat optics, lenses, and lens systems in compliance with the international standard ISO 10110‑7. With its attractive price-performance ratio, advanced technical specifications, and automated documentation, SurfInspect addresses the central challenges in optical manufacturing:
- Time-saving automated inspection processes
- Objective and precise automated evaluations
- Efficient and quick documentation
SurfInspect is designed for companies that manufacture or further process optical components and assemblies. It is particularly suitable for companies that currently perform manual visual inspections and are searching for a cost-effective alternative, as well as for all those who specify optical surfaces according to ISO 10110‑7. The goal is to improve the quality of incoming, intermediate, and final inspections.
Learn more about the new SurfInspect
Highlights at our SPIE AR |VR|MR booth #6617
Meet our experts at SPIE AR|VR|MR 2026
January 20 – 22, 2026 | Moscone West | TRIOPTICS booth 6617
Meet our AR/VR metrology experts at this year’s SPIE AR|VR|MR conference. With their extensive knowledge in AR/VR metrology and the design and development of AR/VR optical components and devices, they’re ready to engage in detailed discussions and share insights. Don’t miss the chance to connect with them at booth #6617.
ImageMaster® PRO AR Reflection
AR waveguide testing solution for high volume production
The ImageMaster® PRO AR Reflection sets new standards with widefield diffraction-limited optics for unmatched accuracy, repeatability, and yield.
Using a conoscope as core technology in the system, the image details are captured using a wide field of view (70° x 52.5°) in a one shot measurement. It offers manufacturers and integrators a comprehensive solution for the image quality validation of optical components for augmented reality (AR) applications.
Join the Plenary Events
AR|VR|MR Session: Sensors + Metrology
Kristin Holzhey | Managing Director TRIOPTICS
January 22, 2026 | 9:45 AM | Main Stage
How TRIOPTICS Enables the Evolution of XR with Optical Metrology
The drive for complete immersion with compact and lightweight AR/VR systems places extreme demands on optical design and manufacturing precision. Over the past decade, significant advancements have been made, particularly in field of view and resolution, with human vision always serving as the gold standard. As a leader in optical metrology and a pioneer in unique and dedicated AR/VR measurement solutions, TRIOPTICS has closely accompanied this journey. We have supported OEMs in achieving an exceptional user experience for optical performance throughout the development and production phases. This presentation will delve into the technological innovations that TRIOPTICS employs to reach the highest standards of image quality and immersion in the XR industry.
AR|VR|MR Panel: Scaling Quality: Taking AR/VR Optical Metrology ‘From Lab to Fab’
Moderator: Mohit Yadav | Global Product Manager – ARVR Metrology at TRIOPTICS
January 22, 2026 | 3:55 PM - 4:45 PM PST | Plenary Stage (Moscone West, Level 3)
The journey “From Lab to Fab” of AR/VR headsets relies on optical metrology, which is the hidden hero for high-quality devices. This panel explores the critical bridge between the precise metrology requirements in R&D prototypes and a good compromise between the throughput and accuracy of mass-produced consumer products. We will explore how measurement errors directly impact user experience, causing visual issues like low resolutions image, blur and color fringes. Experts will discuss key image quality metrics (MTF, Color, Brightness, uniformity, Pupil swim) and the challenge of scaling slow benchtop tests to fast, automated solutions essential for image quality testing & active alignment of components & modules. We will also examine future metrology breakthroughs and the need for ARVR specific standards to match perceived visual quality.
Are you interested in an appointment?
Whether you need advice or already have specific requirements, we will be happy to help you!
Use our contact form and schedule an appointment at the exhibition with our experts.